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J.A. Woollam develops spectroscopic ellipsometer technology used for thin film and bulk materials characterization. Measures thin film thickness and material optical constants. In-situ and ex-situ, spectral ranges from Vacuum UV to Far IR.

The world's second largest organization of physicists, APS publishes physics journals and organizes meetings.

Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the semiconductor, optoelectronics, display, MEMS, data storage, and optical coating industries. SCI a...

The HORIBA Group mission is to provide superior technologies, unique products, and top-quality services in the analytical and measurement fields. Applying core technologies accumulated over the years, HORIBA provides products and services derived fro...

DentonVacuum.com manufactures vacuum deposition systems using sputtering or evaporation for use in electron microscopy, precision optics, research, production & ophthalmic applications. Supplies coated optics & vacuum deposition for customers

A practical resource for lab professionals about modern laboratory equipment and instrumentation Home

IOPscience is a unique platform for IOP-hosted journal content providing site-wide electronic access to more than 130 years of leading scientific research, and incorporates some of the most innovative technologies to enhance your user-experience.

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