Search Results for fpga radiation damage
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ERAI is the industry's leading source of risk assessment information related to counterfeit electronics and high risk parts in the global electronics supply chain.
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IOPscience is a unique platform for IOP-hosted journal content providing site-wide electronic access to more than 130 years of leading scientific research, and incorporates some of the most innovative technologies to enhance your user-experience.
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Manufactures high performance Silicon and Silicon Carbide semiconductors for Analog, Mixed Signal, Switching Power, RF Power & Microwave applications, Power Over Ethernet
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Scientific Literature Digital Library incorporating autonomous citation indexing, awareness and tracking, citation context, related document retrieval, similar document identification, citation graph analysis, and query-sensitive document summaries. ...
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HEP - HEP
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